Compute-in-memory: State space models; ultra-thin AlScN memory; brain-inspired edge AI.
Leveraging patterns in formal verification to reach sign-off faster.
Increasing complexity due to advanced packaging, multi-die assemblies, and more devices under test is having an impact on yield, which in turn slows time to market and impacts overall chip costs. What ...
Fine-tuning TCAD parameters with real-world feedback from test wafers is essential for quantitatively accurate and predictive results.
The relentless march of semiconductor scaling continues to reshape the packaging landscape, driven by Moore’s Law and the ...
Achieving energy-efficient AI systems will require pre-competitive, industry-wide collaboration on foundational capabilities.
Combining GaN transistors with silicon-based digital circuits enables complex computing functions built directly into power ...
The semiconductor industry is entering a critical transition phase toward Autonomous Semiconductor Fabs, driven by escalating ...
As DRAM technologies scale to increasingly tighter pitches, the patterning requirements exceed the limits of conventional ...
Advances in GPU computing and multi-beam mask writing are removing constraints to enable entirely curvilinear masks.
Die-to-die chiplet standards are only the beginning. Many more standards are necessary for a chiplet marketplace. A number of such standards have either had initial versions released or are in ...
AI workloads are driving their adoption in data centers. On the other hand, photonic interconnects require a variety of ...
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